BEGIN:VCALENDAR VERSION:2.0 CALSCALE:GREGORIAN PRODID:iCalendar-Ruby BEGIN:VEVENT CATEGORIES:Lectures & Presentations DESCRIPTION:Dissertation Title: Mixed Type Wafer Defect Pattern Recognition using Ensemble Deformable Convolutional Neural Networks for Chronic Manufa cturing Process Quality Problem Reduction\n\nDissertation Advisor: Dr. Tao Uyan\n\nDepartment: Mechanical & Systems Engineering\n\nDate: December 15\, 2023\n\nTime: 3:30pm-5:00pm\n\nLocation: Stocker Center\, Room 289 DTEND:20231215T220000Z DTSTAMP:20241122T225004Z DTSTART:20231215T203000Z GEO:39.32618;-82.106808 LOCATION:Stocker Center\, 289 SEQUENCE:0 SUMMARY:Mohd Rifat Khan Final Dissertation Defense UID:tag:localist.com\,2008:EventInstance_45022570838376 URL:https://calendar.ohio.edu/event/mohd_rifat_khan_final_dissertation_defe nse END:VEVENT END:VCALENDAR