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ORGANIZER;CN="Hunter, Tiffany":mailto:huntert1@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN=Furkan Can
an:mailto:furkancanan@hotmail.com
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Abukamail,
Nasseef":mailto:abukamai@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Allwine, D
aniel":mailto:allwined@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Bartone, C
hris":mailto:bartone@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Chenji, Ha
rsha":mailto:chenji@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Goble, Jam
es":mailto:goble@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Irwin, Den
nis":mailto:irwind@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Jadwisienc
zak, Wojciech":mailto:jadwisie@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Karanth, A
vinash":mailto:karanth@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Kaya, Sava
s":mailto:kaya@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Kelsey, Ra
lph":mailto:kelsey@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Liu, Chang"
:mailto:liuc@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Liu, Jundo
ng":mailto:liuj1@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Mourning,
Chad":mailto:mourning@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Ostermann,
Shawn":mailto:osterman@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Rahman, Fa
iz":mailto:rahmanf@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Schlicher,
Jared":mailto:schliche@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Ugazio, Sa
brina":mailto:ugazio@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Vasiliadis
, Konstantinos":mailto:vassilia@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Welch, Lon
nie":mailto:welch@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Zhu, Jim":m
ailto:zhuj@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Wang, Zhew
ei":mailto:wangz1@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Lindner, P
atricia":mailto:lindnerp@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Ardrey, Gr
egory":mailto:gardrey@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Yadav, Ani
mesh":mailto:yadava@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Plis, Kevi
n":mailto:plis@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Juedes, Da
vid":mailto:juedes@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Fox, Patri
ck":mailto:pfox@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Patterson,
James":mailto:pattersj@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Steinberg,
Eric":mailto:steinber@ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN=eecs_bscs@
listserv.ohio.edu:mailto:eecs_bscs@listserv.ohio.edu
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listserv.ohio.edu:mailto:eecs_bsee@listserv.ohio.edu
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listserv.ohio.edu:mailto:eecs_mscs@listserv.ohio.edu
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istserv.ohio.edu:mailto:eecs_phd@listserv.ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN='eecs_msee
@listserv.ohio.edu':mailto:eecs_msee@listserv.ohio.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Schultz, A
dam":mailto:schultza@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Burchfield
, Makayla":mailto:mb069517@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Mullett, D
rew":mailto:dm247120@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Ghauri, Ah
mad":mailto:ag592521@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Zhang, Yua
nhang":mailto:yz140212@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Yuan, Weiq
iang":mailto:wy818711@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Gant, Ian":
mailto:ig622218@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Bragg, Ang
ie":mailto:ab824022@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Barat, Aak
riti":mailto:ab613319@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Lele, Kal":
mailto:kl121916@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Flaherty,
Aidan":mailto:af674321@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Agyeman, A
mos":mailto:aa852712@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Marusek, J
osh":mailto:jm553020@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Spelic, As
hley":mailto:as182219@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Chauhan, S
aumya":mailto:sc357320@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Taylor, Za
ch":mailto:zt133220@ohio.edu
ATTENDEE;ROLE=OPT-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=TRUE;CN="Byreddy, P
ranay":mailto:pb972315@ohio.edu
DESCRIPTION;LANGUAGE=en-US:Title: Designing novel gate work function engine
ered FinFETs for CMOS scaling\, hardware security and neuromorphic computi
ng\n\nAbstract: Scaling CMOS logic circuits to build low power and compact
devices has utmost importance in modern CMOS technology. Schottky Barrier
FinFET transistors can offer a solution for sub 10nm transistor design as
it affects the process minimally. Gate workfunction engineered Schottky B
arrier FinFETs can be used to minimize the number of transistors used in a
CMOS digital circuit\, making it power and area efficient while staying c
ompetitive for power delay product. Characterization of Schottky Barrier F
inFETs for very large system integration involves different steps from dev
ice level to system level abstraction. Gate work function engineered Schot
tky Barrier FinFETs can also be utilized to build multi input logic circui
ts and fine grain reconfigurable logic circuits which are especially impor
tant for hardware security applications. Extending the idea of gate work f
unction engineering to tunneling transistors can lead to ultra low power a
nd ultra fast green transistors reaching beyond 60mV/decade thermodynamic
limit of thermionic emission. For the future research work\, gate work fun
ction engineered SiGe based tunneling FETs may be useful for in-memory com
puting in the area of neuromorphic computing.\n\nBio: Talha Furkan Canan r
eceived the B.S. degree from Department of Electrical and Electronics Engi
neering\, Bilkent University\, Ankara\, Turkey\, in 2015. Following his wo
rk as research engineer in CAD modelling of GaN HEMT devices at the Nanote
chnology Research Center in Bilkent University\, he joined Ohio University
in 2016 to commence his Ph.D. work on nano-scale CMOS integrated systems\
, logic devices and interconnects for kilocore computing architectures. He
prepared his dissertation on "Design of Ultra-Compact and Low-Power sub-1
0 Nanometer Logic Circuits with Schottky Barrier Contacts and Gate Work-Fu
nction Engineering". After receiving his Ph.D. degree\, he joined Sony Ele
ctronics Image Sensor Design Center and worked on different technical proj
ects related with unit pixel scaling\, single photon avalanche photodiode
design\, conversion gain improvement and optical characterization of image
sensors. His research interests include design of ultra low power and com
pact logic circuits\, tunneling transistors\, III-V and III-N semiconducto
r devices\, CMOS image sensors\, avalanche photodiodes\, hardware security
\, thin-film transistors and hot electron and ionization diodes. Dr. Canan
is an expert on semiconductor electronics and device simulations with mor
e than ten years of professional experience. He was a recipient of G.E. Sm
ith and G.V. Smith Memorial Engineering Award for Electrical Engineering a
nd Computer Science Department at Ohio University at 2021 and Nanoscale Qu
antum Phenomenon Institute Award at 2019. Currently\, he has one patent an
d twelve publications including five journal papers.\n____________________
____________________________________________________________\nMicrosoft Te
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