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28 West Green Drive, Athens, Ohio 45701

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Dissertation Title:  Mixed Type Wafer Defect Pattern Recognition using Ensemble Deformable Convolutional Neural Networks for Chronic Manufacturing Process Quality Problem Reduction

Dissertation Advisor:  Dr. Tao Uyan

Department:  Mechanical & Systems Engineering

Date:  December 15, 2023

Time:  3:30pm-5:00pm

Location:  Stocker Center, Room 289

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